Corelis JTAG Webinars Available On Demand
An effective JTAG/Boundary Scan test strategy is essential for organizations producing and testing densely-populated digital electronic systems with fine-pitch ICs. View our on-demand webinars to gain insights into the benefits of JTAG and design-for-test tips to ensure successful deployment.
Webinar #1:
Why JTAG/Boundary Scan Testing Makes Sense
Why board and system-level testing is essential throughout the product life cycle.
How JTAG/boundary-scan can improve test coverage and reduce test time.
Integrating JTAG with existing test systems.
Corelis products and services for design-for-testability (DFT) review and test development. To view webinar #1, click on the image on the right.
Topics covered in this Webinar:
- Why board and system-level testing is essential throughout the product life cycle.
- How JTAG/boundary-scan can improve test coverage and reduce test time.
- Integrating JTAG with existing test systems.
- Corelis products and services for design-for-testability (DFT) review and test development.
Webinar #2:
JTAG DFT Guidelines for Circuit Board Designers
In today's fast paced environment with short time-to-market requirements, it has become increasingly important to design products that allow for early fault and failure detection. To view webinar #2, click on the image on the right.
Topics covered in this Webinar:
- The fundamentals of testing with JTAG/Boundary Scan.
- Board design techniques for producing reliable, high-speed JTAG scan-chains.
- Designing circuits to enable JTAG testing of non-JTAG components with indirect access.
- Common hurdles to designing for JTAG testability and their solutions.
- Optimizing PCB layout for successful JTAG/Boundary Scan testing.