Benefits of Boundary-Scan for PCB Assembly Testing

The Benefits of Boundary-Scan for PCB Assembly Testing

Businesses often categorize PCB assembly testing tools and methods as an expense rather than something that adds value to the end product. So, why should companies bother with PCB assembly testing?

Conducting product testing on printed circuit boards (PCBs) has the potential to become costly. Because of this, it’s easy for businesses to view PCB assembly testing as an expense without much value.
So, why test?

The answer is two-fold. First, manufacturers can’t guarantee product quality without testing. Second, when done correctly, testing saves companies time and money in the long term. Inadequate testing can result in inferior quality products getting shipped to end customers, leading to warranty repairs, field failures that require replacement, an inferior product image, and—depending on the industry—even incite potential lawsuits.

On the other hand, adequate testing doesn’t mean that every product requires 100% test coverage. The costs of the tests necessary to achieve the last few points toward 100% are often not only unnecessary, but costly to a point where both production costs and the retail cost of the product can increase exponentially.
It’s essential to assess the optimum amount of testing for a given product and industry to maintain a high-quality product while also limiting the overall cost of test. For example, military and aerospace products require a significantly higher investment in test when compared to other industries due to the nature of their mission-critical operation. On the other end of this spectrum, however, lower-cost consumer electronic products, where some amount of product defects may be acceptable, typically requires a smaller test investment.
Finding Optimum Testing Coverage
Three main elements of a PCB assembly are evaluated during testing: structural devices, structural connections, and functional connections. These elements are assessed using a combination of popular visual, electrical, and functional testing methods, including automated optical inspection (AOI), automated X-ray inspection (AXI), in-circuit testing (ICT), JTAG boundary-scan, and customized test software.
Many PCB assembly manufacturers use an approach known as PCOLA/SOQ/FAM when evaluating the effectiveness of test systems for their products. This approach defines a defect-spectrum of fault categories for assembled PCBs that can be used by test engineers to calculate a score for defect coverage. The “PCOLA” segment of the test evaluates the structural devices of a populated PCB using visual testing methods. This portion of the test looks at presence, correctness, orientation, live, and alignment.
• Presence: Does the component exist? Is it present?
• Correctness: Is the correct component installed?
• Orientation: Is the orientation of the component correct?
• Live: Is the component operational? Does the component respond to stimulus?
• Alignment: Is the alignment of the component skewed or within acceptable tolerance?
The “SOQ” segment uses electrical testing methods to evaluate shorts, opens, and quality. These are connectivity tests to ensure an accurate electrical connection between components as well as identify the quality of those connections.
• Shorts: Is the component connection point incorrectly connected to another connection point?
• Opens: Is the component connection missing a connection to another connection point?
• Quality: Does the component connection conform to quality standards?
Functional testing, which is the last type of test process in the PCOLA/SOQ/FAM defect spectrum, evaluates features, at-speed, and measurement. These tests ensure that components and connections in the system are functioning as expected and measure performance against known benchmarks.
• Features: Is the component feature present?
• At-Speed: Can the component or connection be tested at minimum and maximum speeds?
• Measurement: Can component or connection attributes be measured?
While several testing methods are available, test budgets necessitate manufacturers to select test methods that provide comprehensive coverage of the PCOLA/SOQ/FAM spectrum. A breakdown of the PCOLA/SOQ/FAM approach and the applicable tests can be seen in the table below:

When making decisions about testing and achieving the optimum amount of coverage, it’s important to consider which test methods include a significant portion of the PCOLA/SOQ/FAM defect-spectrum. JTAG boundary-scan, a method for testing PCBs when physical test access is limited, is ideal for this reason. Unlike other methods, boundary-scan can perform tests covering a significant portion of the PCOLA/SOQ/FAM spectrum. Because of this, JTAG boundary-scan testing is often able to reduce or even eliminate the need for additional structural testing methods and equipment:
PCOLA Test Methods and CoverageOther Benefits of JTAG Boundary-Scan Testing
JTAG boundary-scan testing provides a high-level of coverage for PCB testing, but it also offers cost savings in other ways. Equipment acquisition, test procedure development, training, and labor expenses are among the inherent costs of performing boundary-scan testing.
These costs may sound expensive, but performing boundary-scan testing is actually less costly than using popular PCB testing methods like ICT. In fact, in addition to the cost of equipment acquisitions, procedure development, and training and labor, ICT requires test fixture development and equipment maintenance, which are costs that aren’t incurred in boundary-scan testing.
Additional benefits to consider are:
• Significant product yield increase
• Reusable test patterns
• Reduced test time
• Reduced time to market

The Bottom Line

When selecting testing methods, manufacturers must take numerous factors into consideration, including when each method can be deployed, equipment and maintenance costs, and the amount of defect-spectrum coverage. Among the most popular test methods, JTAG boundary-scan testing stands out as the most affordable and versatile option to best meet these factors.
Please contact us for further information.

Corelis JTAG Webinars Available On Demand

An effective JTAG/Boundary Scan test strategy is essential for organizations producing and testing densely-populated digital electronic systems with fine-pitch ICs. View our on-demand webinars to gain insights into the benefits of JTAG and design-for-test tips to ensure successful deployment.

Webinar #1:
Why JTAG/Boundary Scan Testing Makes Sense

Warum JTAG Boundary-Scan sinnvoll istWhy board and system-level testing is essential throughout the product life cycle.
How JTAG/boundary-scan can improve test coverage and reduce test time.
Integrating JTAG with existing test systems.
Corelis products and services for design-for-testability (DFT) review and test development. To view webinar #1, click on the image on the right.

Topics covered in this Webinar:

  • Why board and system-level testing is essential throughout the product life cycle.
  • How JTAG/boundary-scan can improve test coverage and reduce test time.
  • Integrating JTAG with existing test systems.
  • Corelis products and services for design-for-testability (DFT) review and test development.

Webinar #2:
JTAG DFT Guidelines for Circuit Board Designers

Webinar JTAG Design RulesIn today's fast paced environment with short time-to-market requirements, it has become increasingly important to design products that allow for early fault and failure detection. To view webinar #2, click on the image on the right.

Topics covered in this Webinar:

  • The fundamentals of testing with JTAG/Boundary Scan.
  • Board design techniques for producing reliable, high-speed JTAG scan-chains.
  • Designing circuits to enable JTAG testing of non-JTAG components with indirect access.
  • Common hurdles to designing for JTAG testability and their solutions.
  • Optimizing PCB layout for successful JTAG/Boundary Scan testing.

Testing Boards with Boundary Scan - Principles and Technical Requirements

Scan Express Tool Chain and JTAG ControllersBoundary Scan is a method of testing electronic assemblies, primarily but not limited to assemblies with a high degree of digital components. The only technical requirement is the existence of at least one component with an interface according to JTAG IEEE 1149.1. The assumption that only components that have such an interface is not true. It is important to have access to non-JTAG components through a JTAG-capable device. Even analog components can be tested if the design has been carefully planned and designed for testability.

Corelis ScanExpress consists of a number of software components used to generate, execute and analyse test plans based on JTAG/Boundary Scan. All software components run  in Windows 7, 8, 8.1 or Windows 10.

Typically, the unit under test (UUT) is connected to the PC running ScanExpress through a  JTAG controller, available in a variety of form factors. For development of test plans, verification of prototype hardware and desktop use, a USB-connected JTAG controller with a single TAP (Test Access Port) will be a good choice. In a  production line, a PCIe, LAN or USB based multi-TAP controller may be the best option. Some of the available JTAG controllers easily integrate into National Instruments test systems under LabView.

If you want to learn more about Boundary Scan or, how to integrate Boundary Scan into an ICT system or, about  possibilities and limitations of this fascinating technology, please contact us. We have used Boundary Scan successfully for many years in our own and customer projects. Our experience enables us to assess whether or nor Boundary Scan is a useful option for your testing needs.

Design for Test (Testability)

To analyse the testabilty, especially during development, ScanExpress DFT (Design for Test, P/N Nr. 20300) is very useful. ScanExpress DFT gives the designer hints how to modify the design in order to improve test coverage. Design errors can be detected at an early stage, potentially reducing the number of design spins.

Generation of Test Plans

The generation of test patterns used to execute boundary scan tests is accomplished with ScanExpress TPG (Test Pattern Generator, P/N. 20400). Boundary Scan typically cannot be used to test hardware at speed. That is because pins of a device with a JTAG port are actuated via the so-called scan-chain which inherently does not have the timing of the device under test. There is an interesting article that explains the concept of JTAG/Boundary Scan technology.

However, Corelis has a Boundary Scan extension that remedies the problem of the basic Boundary Scan test method: ScanExpress JET can be used to comfortably test Ethernet, CAN, UART or USB interfaces at speed. Furthermore, SDRAM (DDR, DDR2, DDR3, DDR4) can be tested at system speed, while flash devices, serial flash, EEPROMs and CPLDs can be programmed from within the test procedure. The list of devices supported by JET is constantly being expanded.

Testing multiple Boards

If a combination of boards designed separately requires Boundary Scan testing, ScanExpress Merge (P/N 20196) is required. ScanExpress Merge merges net and component data into a single set of files that can be used by TPG to create test files. ScanExpress Merge is also helpful if a board is tested in combination with a test fixture that also contains JTAG/Boundary Scan capable devices.

Test Execution and Analysis

ScanExpress Runner (P/N 20650) is the central software component used to execute test plans generated with the tools described above. ScanExpress ADO (Advanced Diagnostic Option, P/N 20210) and ScanExpress Viewer (P/N 20315) are add-ons to Runner that generate concise test reports and visualize results. ADO and Viewer are especially helpful when tests are carried out by someone who has little or no background knowledge of the boards being tested, e.g. assembly line personnel.

Testing and Programming I²C and SPI Components

SPI or I²C devices can be tested and programmed even without being connected to a Boundary Scan device if connected to a set of special pins available on the TAP (test access port) of all Corelis JTAG controllers. ScanExpress Programmer JTAG (P/N 20603) and ScanExpress Programmer SPI/I2C (P/N 20601) are the software components used for that purpose.

Interactive Debugger

An interactive Debugger (ScanExpress Debugger, P/N 20409) can be used to analyse problematic circuitry using a C-like script language. There is an interesting video explaining the capabilities of this excellent tool.

JTAG Embedded Test (JET)

ScanExpress JET greatly enhances automatic circuit board testing by extending boundary-scan structural test coverage to virtually every signal on the board that is accessible by an on-board CPU, DSP or microcontroller. ScanExpress JET utilizes proprietary “JTAG Embedded Test” (JET) technology, which uses a processor’s JTAG debug port to download and control native processor code to perform at-speed functional testing of the UUT. JET seamlessly integrates with traditional boundary-scan testing. When running tests using ScanExpress, JET becomes virtually invisible other than it significantly accelerates the test procedure.
Read more about JET.

 

Integration von ICT und Boundary-Scan

ScanExpress can easily be integrated with traditional ICT systems (Bed-of-Nails, Flying Probes) provided by a number of manufacturers such as SPEA, Takaya, Agilent, Checksum, SEICA, Teradyne and others. Combining Boundary Scan and ICT yields the best possible test coverage while minimizing development efforts and investments.

Boundary Scan Application Support

Corelis and local resellers provide education and hands-on support during all phases of your Boundary Scan projects. Individual support is available on request, e.g. if you need to assess and optimize the test coverage of a board design in progress. Please, do not hesitate to contact us by phone (+49-211-2714630) or using our contact form.
More Information on ScanExpress Boundary Scan tools can be found at the Corelis Website.

Corelis Boundary Scan Board Level Test Systems

Corelis offers an extensive line of ScanExpress software modules that can be custom tailored to create the right boundary-scan package for any user. Corelis’ ScanExpress software is compatible with Microsoft Windows 7, Windows 8/8.1, Windows 10 and 11 as well as all of Corelis’ hardware platforms. Furthermore, DLLs of these functions for integration National Instruments' LabView, LabWindows/CVI, TestStand, Geotest ATEasy, Agilent's VEE, Visual Basic and C++ are available.

ScanExpress software version 10.2.0 is now available to all users with a current maintenance contract and with new software purchases. Release notes for this version are found further down this page.

 

ScanExpress Software Components for Testing Electronic Assemblies using Boundary-Scan

ScanExpress TPG – Test Pattern Generation ScanExpress TPG™ is an intelligent test pattern generator that enhances the process of boundary-scan automation at an exceptional level of ease of use. ScanExpress TPG automatically generates test patterns that facilitate pin-level fault detection and isolation of all boundary-scan testable nets on a printed circuit board (PCB). ScanExpress TPG also creates test vectors to detect faults on pins of non-JTAG components such as clusters and memories that are accessible by IEEE-1149.1 compatible devices.

ScanExpress JET – JTAG Embedded TestScanExpress JET™ represents state-of-the-art in automatic circuit board testing by extending boundary-scan structural test coverage to virtually every signal on the board that is accessible by an on-board CPU. ScanExpress JET utilizes proprietary “JTAG Embedded Test” (JET) technology, which uses a processor’s JTAG debug port to download and control native processor code to perform at-speed functional testing of the UUT.

ScanExpress DFT Analyzer – Design for Testability MetricsScanExpress DFT™ Analyzer is able to accurately calculate the test coverage of boards and systems that include a mix of both boundary-scan and non-boundary-scan devices. The software additionally helps development engineers detect low coverage areas on their designs allowing them to make decisions on increasing fault coverage before the board is sent for layout.
Test Execution System

ScanExpress Runner – Test Program ExecutionScanExpress Runner™ provides a runtime executive environment that is friendly for design, production, and field service. ScanExpress Runner allows users to execute a test sequence or individual test steps based on test patterns generated with ScanExpress TPG and/or ScanExpress JET. To identify failures - if any -  a truth table diagnostic display is generated for further inspection.


ScanExpress Runner Gang – High Volume Test Program ExecutionScanExpress Runner Gang™ is the workhorse software piece to perform parallel gang testing and In-System Programming of CPLDs and Flash devices. This solution is fully concurrent and allows simultaneous testing of multiple boards using a single PC and a single operator. ScanExpress Runner Gang addresses high-throughput boundary-scan applications including high-volume production.

 

view iconScanExpress Viewer™ is a powerful graphical fault identification system that helps to isolate the source and location of faults encountered during boundary-scan test of printed circuit board assemblies. The device and pin location capabilities provide test operators the immediate board location of the faulty pin or net.

 

SoftwareScanExpress ADO – Advanced Diagnostics

ScanExpress ADO™ is an add-on option for the ScanExpress Runner and ScanExpress Runner Gang execution environments. The Advanced Diagnostics Option automates test vector analysis by intelligently deciphering standard truth table diagnostic information and presenting specific fault information to the user in a detailed verbose format.

 

ScanExpress Merge – System Level Testing across AssembliesScanExpress Merge™ makes system-level boundary-scan test development a snap by automatically combining multiple target assemblies into a single boundary-scan compatible target system. The tool provides automatic handling for each board netlist, scan-chain, and interconnect information.

 

ScanExpress JTAG Debugger – Interactive DebuggingScanExpress JTAG Debugger™ provides a simple, stand-alone environment for complete pin control over any boundary-scan device. The interactive graphical user interface lets users mimic the functionality of a logic analyzer by observing all boundary-scan controllable inputs while also providing the capability to drive output pins to specific logic states. The software can be used to quickly apply patterns to specific areas of a board giving immediate feedback when faults are detected.

Boundary-Scan In-System Programming (ISP) Tools

ScanExpress JTAG Programmer – In-Circuit Programming ToolScanExpress JTAG Programmer™ is a universal in-circuit programming tool that can program and verify Flash memories, serial EEPROMs, CPLDs, FPGAs, and other programmable logic devices. Programming methods include JTAG, I2C, SPI, and Target Assisted. The extensive device library includes chip manufacturers such as Altera, Cypress, Micron, Spansion, Intel, Microchip, ST Microelectronics, Texas Instruments, Xilinx, and many more.

 

ScanExpress Flash Generator – Flash Programming File Generation ToolThe ScanExpress Flash Generator™ creates a Board File, which is used to provide ScanExpress Programmer (or other compatible applications) with the necessary information to program a given target board configuration. ScanExpress Flash Generator can be used as a standalone utility or as a module integrated with the ScanExpress TPG environment.

 


ScanExpress Version 9.4.x Release Notes

Corelis ScanExpress applications have been updated with the latest features, enhancements, and device support.
ScanExpress Runner now includes an asynchronous API for integration with third party applications. The asynchronous execution functions allow applications to integrate ScanExpress Runner functionality without having to wait for execution to finish—applications can now begin execution and then poll to determine current status or abort the current execution.

The new functions are:
AsyncAbort() Aborts asynchronous Test Plan execution.
AsyncGetStatus() Retrieves the current status and completion percentage of asynchronous Test Plan execution.
AsyncRunTestPlan() Runs the currently loaded Test Plan asynchronously, returning immediately.
ScanExpress Runner Diagnostic & Logging Improvements

ScanExpress Runner now includes full test plan and test step path information in the test log file for improved traceability. Additionally, flash manufacturer and device ID information will now be included in diagnostics and test logs when Device ID tests pass. Finally, we’ve improved JAM/STAPL diagnostics to include additional checksum data when available.
ScanExpress Runner Gang USB-1149.1/4E

ScanExpress Runner Gang can now utilize USB-1149.1/4E and QuadTAP/CFM hardware for concurrent test execution. Gang (concurrent) tests on up to 4 TAPs can now be run on the benchtop with USB-1149.1/4E hardware or integrated into Teradyne testers with the QuadTAP/CFM and expander cards.
ScanExpress JET CPU Support & Improvements

ScanExpress JET supports many microcontrollers, FPGAs, and SoCs, e.g. Infineon's Aurix, Nvidia's Tegra K1, NXP's CorIQ P2, Xilinx Zynq, and Mobileye's EyeQ3 devices. Starting with version 9.4 ScanExpress JET supports Marvell OCTEON III CN7200 Multi-Core MIPS64 Processors and Texas Instruments TMS320C6748 DSP Processors. Each new processor support package includes base RAM and NOR flash tests and programming support. Please contact Corelis Sales for pricing and availability. Additionally, Ethernet loopback tests are now included for NXP i.MX6 Applications Processors.

Corelis ScanExpress 9.4 is now available free for customers under maintenance. Please, inquire for more information.


 

JTAG Controllers for Board Level Testing

A wide selection of JTAG (boundary-scan) hardware controllers is available from Corelis, including PCI, PCI Express, USB 2.0, Ethernet/LAN, PXI/cPCI and VXI, with price and performance to meet your specific requirements. For performance critical JTAG applications, Corelis offers boundary-scan controllers that operate at up to 100MHz sustained TCK frequency, enabling fast board JTAG interconnect testing and JTAG programming of flash memories at their maximum theoretical speed. From single-TAP JTAG-controllers for development and test bench use to multi-TAP controllers for inline volume production testing, there is a suitable controller for every purpose.

Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).

For more information on JTAG technology, please check out the JTAG tutorial. You may also be interested in how to debug a dead board.

 

Analysers / Exercisers for I²C and SMBus

The high performance CAS-1000 I2C/E I2C/SMBus bus analyzer and exerciser is an enhanced model targeted towards IC verification and parametric testing in I²C and SMBus topologies. The CAS-1000-I2C/E hardware provides more advanced features such as master and slave emulation, bus specification validation, bus parameter measurement, glitch injection, clock stretching, and adjustable timing skew. In conjunction with Corelis ScanExpress software, the CAS-1000 controller can be used for Boundary Scan testing of complete boards as well as for (interconnect test, etc.) as well as for in-system-programming of Flash memory and CPLDs.

More information on Corelis Boundary Scan products, consulting and training is available on request.

Note: If in doubt which products or product combination suits your testing and programming needs, please, feel free to contact us or our European representatives.